Package with metal-insulator-metal capacitor and method of manufacturing the same

ABSTRACT

A package includes a chip formed in a first area of the package and a molding compound formed in a second area of the package adjacent to the first area. A first polymer layer is formed on the chip and the molding compound, a second polymer layer is formed on the first polymer layer, and a plurality of interconnect structures is formed between the first polymer layer and the second polymer layer. A metal-insulator-metal (MIM) capacitor is formed on the second polymer layer and electrically coupled to at least one of the plurality of interconnect structures. A metal bump is formed over and electrically coupled to at least one of the plurality of interconnect structures.

REFERENCE TO RELATED APPLICATIONS

This Application is a Continuation of U.S. application Ser. No.16/371,356, filed on Apr. 1, 2019, which is a Continuation of U.S.application Ser. No. 15/937,188, filed on Mar. 27, 2018 (now U.S. Pat.No. 10,276,484, issued on Apr. 30, 2019), which is a Continuation ofU.S. application Ser. No. 13/536,877, filed on Jun. 28, 2012 (now U.S.Pat. No. 9,960,106, issued on May 1, 2018), which claims the benefit ofU.S. Provisional Application No. 61/649,140, filed on May 18, 2012. Thecontents of the above-referenced Patent Applications are herebyincorporated by reference in their entirety.

TECHNICAL FIELD

The disclosure relates to packages and methods of manufacturing thepackages, and more particularly to packages with metal-insulator-metal(MIM) capacitors and methods of manufacturing the same.

BACKGROUND

Radio frequency (RF) and mixed-signal integrated circuits employcapacitor elements for decoupling, filtering, oscillating, etc.Metal-insulator-metal (MIM) capacitor structure has been the mostpopular capacitor in analog, mixed-signal and RF devices, due to anadvantage that metal provides depletion-free, high-conductanceelectrodes suitable for high-speed applications at low cost. The MIMcapacitor structure has an advantage of flexibility in inserting itbetween two intermediate metal levels. For increasingly complexmixed-signal and RF applications, the MIM capacitor area is limited bychip size parameters.

BRIEF DESCRIPTION OF THE DRAWINGS

FIGS. 1-10 are cross-sectional views of a method of manufacturing apackage with a metal-insulator-metal (MIM) capacitor according to one ormore embodiments;

FIG. 11 is a cross-sectional view of a package with a MIM capacitoraccording to one or more embodiments;

FIG. 12 is a cross-sectional view of a package with a MIM capacitoraccording to one or more embodiments;

FIG. 13 is a cross-sectional view of a package with a MIM capacitoraccording to one or more embodiments;

FIGS. 14-16 are cross-sectional views of packages with dualpost-passivation interconnect (PPI) structures and MIM capacitorsaccording to one or more embodiments; and

FIGS. 17-21 are cross-sectional views of a method of manufacturing apackage with a MIM capacitor according to one or more embodiments.

DETAILED DESCRIPTION

It is to be understood that the following disclosure provides manydifferent embodiments or examples, for implementing different featuresof various embodiments. Specific examples of components and arrangementsare described below to simplify the present disclosure. The presentdisclosure may, however, be embodied in many different forms and shouldnot be construed as being limited to the embodiments set forth herein;rather, these embodiments are provided so that this description will bethorough and complete, and will fully convey the present disclosure tothose of ordinary skill in the art. It will be apparent, however, thatone or more embodiments may be practiced without these specific details.

In the drawings, the thickness and width of layers and regions areexaggerated for clarity. Like reference numerals in the drawings denotelike elements. The elements and regions illustrated in the figures areschematic in nature, and thus relative sizes or intervals illustrated inthe figures are not intended to limit the scope of the presentdisclosure.

FIGS. 1-10 are cross-sectional views of a package at various stages of amethod of manufacturing the package with a metal-insulator-metal (MIM)capacitor according one or more embodiments.

Referring to FIG. 1, at least one chip 100 is attached to a carrierwafer 200 through an adhesive film 202. Several dozen chips 100 orseveral hundred chips 100 or more may be attached to the carrier wafer200, depending on the size of the chips 100, the size of carrier wafer200, and the particular application, as examples. The chip 100 has afirst side 100 a (also referred to herein as a front side 100 a) and asecond side 100 b (also referred to herein as a back side 100 b). Thechip 100 has semiconductor devices or integrated circuits that have beenpreviously manufactured on a wafer and then singulated from the wafer.The chip 100 may comprise one or more layers of electrical circuitryand/or electronic functions formed on a semiconductor substrate, and mayinclude conductive lines, vias, capacitors, diodes, transistors,resistors, inductors, and/or other electrical components, for example. Apick and place machine may be used to place the chip 100 inpredetermined locations on the carrier wafer 200, for example. In someembodiments, the back side 100 b of the chip 100 is attached to theadhesive film 202, such that the chip 100 is mounted face-up on thecarrier wafer 200.

The chip 100 shown in FIG. 1 includes a semiconductor substrate 10, aplurality of pads 12, a passivation layer 14, an insulating layer 16 anda plurality of contacts 18. The semiconductor substrate 10 havingelectrical circuitry formed therein and/or thereon in accordance withsome embodiments. The semiconductor substrate 10 may comprise, forexample, bulk silicon, doped or undoped, or an active layer of asemiconductor-on-insulator (SOI) substrate. Other substrates, such as amulti-layered or gradient substrate may also be used. The electricalcircuitry formed in and/or on the semiconductor substrate 10 may be anytype of circuitry suitable for a particular application. In someembodiments, the electrical circuitry includes electrical devices formedon the substrate 10 having one or more dielectric layers overlying theelectrical devices. Metal layers may be formed between dielectric layersto route electrical signals between the electrical devices. Electricaldevices may also be formed in one or more dielectric layers. Forexample, the electrical circuitry may include various N-type metal-oxidesemiconductor (NMOS) and/or P-type metal-oxide semiconductor (PMOS)devices, such as transistors, capacitors, resistors, diodes,photo-diodes, fuses, and the like, interconnected to perform one or morefunctions. The functions may include memory structures, processingstructures, sensors, amplifiers, power distribution, input/outputcircuitry, or the like. One of ordinary skill in the art will appreciatethat the above examples are provided for illustrative purposes only tofurther explain applications of some illustrative embodiments and arenot meant to limit the disclosure in any manner. Other circuitry may beused as appropriate for a given application. One or more dielectriclayers and associated metallization layers are formed over theelectrical circuitry, and contacts may be formed through the dielectriclayer to provide a connection to the electrical circuitry.

The pads 12 are formed on the semiconductor substrate 10. In someembodiments, the pad 12 is formed of aluminum, aluminum copper, aluminumalloys, copper, copper alloys, or the like. One or more passivationlayers, such as a passivation layer 14 are formed and patterned over thepad 12. In some embodiments, the passivation layer 14 is formed of adielectric material, such as undoped silicate glass (USG), siliconnitride, silicon oxide, silicon oxynitride or a non-porous material byany suitable method, such as chemical vapor deposition (CVD), physicalvapor deposition (PVD), or the like. The passivation layer 14 is formedand patterned to cover a peripheral portion of the pad 12, and to exposea portion of the pad 12 through an opening in passivation layer 14. Thecontacts 18 are formed over the exposed portions of the pads 12 throughopenings in the insulating layer 16 over the passivation layer 14. Insome embodiments, the contact 18 is formed of copper, copper alloys,aluminum, aluminum alloys, or the like. The contacts 18 may be formed asvias, plugs, pillars or lines in the insulating layer 16 to makeelectrical contact with the pads 12. In some embodiments, the insulatinglayer 16 is a polymer layer or a dielectric material. In at least oneembodiment, the top surface of the contacts 18 are exposed from theinsulating layer 16 for electrical coupling to subsequently formedwiring layers.

Referring to FIG. 2, a molding compound 204 is formed to fill gapsbetween the chips 100. In some embodiments, the molding compound 204 isprovided over the chips 100 and portions of the adhesive film 202between the chips 100, and then a grinding process is performed on themolding compound 204 to expose a top surface 100 s of the front side 100a of each chip 100, so that the top surface 204 a of the moldingcompound 204 becomes substantially level with the top surfaces 100 s ofthe chips 100. The grinding process may planarize the top surface 100 sof the chip 104, so that any unevenness in the top surface 100 s of thechip 100 may be at least reduced, and possibly substantially eliminated.Furthermore, a height or thickness of the chip 100 may be reduced to aselected height through the grinding process. This results in areconstructed wafer 400 that includes first areas I (also referred toherein as chip areas I) and second areas II (also referred to herein asfan-out areas II). On the chip area I, the chip 100 is formed. On thefan-out area II, the molding compound 204 is formed. Subsequently formedwiring layers can be formed over the molding compound 204 toelectrically connect the chip 100.

Referring to FIG. 3, a first polymer layer 206 is formed and patternedon the reconstructed wafer 400 to cover the top surfaces 100 s of thechips 100 and the top surface 204 a of the molding compound 204, andthen post-passivation interconnect (PPI) structures 208 are formed onthe first polymer layer 206. In some embodiments, the first polymerlayer 206 includes a polybenzoxazole (PBO) layer, a polyimide layer, abenzocyclobutene (BCB) layer, an epoxy layer, or a photo-sensitivematerial layer. In at least one exemplary embodiment, the first polymerlayer 206 is formed of low-temperature PBO layer. The first polymerlayer 206 can be patterned by photolithography processes to formopenings, through which the underlying contacts 18 are exposed. The PPIstructures 208 can be electrically coupled to the contacts 18 of thechips 100 through the openings formed in the patterned polymer layer206. In some embodiments, the PPI structures 208 are metallizationlayers formed of copper, aluminum, copper alloys, or other mobileconductive materials using plating, electroless plating, sputtering,chemical vapor deposition methods with a photoresist mask. The PPIstructures 208 can be formed in the openings of the first polymer layer206 to electrically connect with the contacts 18, and extend to thesurface of the first polymer layer 206. In some embodiments, the PPIstructures 208 can be formed over the chip areas I and/or the fan-outareas II. The PPI structures 208 can function as interconnection layers,power lines, re-distribution lines (RDL), inductors, capacitors or anypassive components. Each PPI structure 208 includes a first region 208Aand a second region 208B. The first region 208A is also referred toherein as an interconnect line region 208A, and the second region 208Bis also referred to herein as a landing region 208B on which a bumpfeature and/or a capacitor will be formed in subsequent processes. Theembodiment of FIG. 3 shows the landing region 208B positioned outsidethe contact 18. In other embodiments, the landing region 208B can beformed directly over the contact 18 through the routing of the PPIstructures 208.

Referring to FIG. 4, a second polymer layer 210 is formed on the firstpolymer layer 206 and the PPI structures 208. A plurality of openings210 a is formed in the second polymer layer 210 to expose a portion ofthe second region 208B of the PPI structures 208. In some embodiments,the second polymer layer 210 includes a polybenzoxazole (PBO) layer, apolyimide layer, a benzocyclobutene (BCB) layer, an epoxy layer, or aphoto-sensitive material layer. The second polymer layer 210 may beformed of the same material as the first polymer layer 206. The designson number and location of the openings 210 are flexible according todevice performance requests. The embodiment in FIG. 4 shows the openings210 a exposing the first landing region 208B₁ on which a capacitor willbe formed and the second landing region 208B₂ on which a bump will beformed.

FIG. 5 shows the formation of a metal-insulator-metal (MIM) capacitor300 on the first landing region 208B₁ of the PPI structure 208, leavingthe second landing region 208B₂ for bump formation. In at least oneembodiment, the MIM capacitor 300 is formed on the first landing region208B₁ through the opening 210 a of the second polymer layer 210, and theMIM capacitor 300 may extend to the surface of the second polymer layer210. In at least one embodiment, the MIM capacitor 300 includes a lowermetal layer 310; an upper metal layer 330 and a capacitor dielectriclayer 320 formed between the metal layers 310 and 330. The lower metallayer 310 may include a titanium (Ti) layer, a titanium nitride (TiN)layer, or combinations thereof. The upper metal layer 330 may include atitanium (Ti) layer, a titanium nitride (TiN) layer, or combinationsthereof. In some embodiments, the lower metal layer 310 has a thicknessbetween about 500 Angstroms and about 1500 Angstroms, and the uppermetal layer 330 has a thickness between about 500 Angstroms and about1500 Angstroms. The capacitor dielectric layer 320 may include a nitridelayer, a silicon nitride layer, or other dielectric material layers ofhigh dielectric constant. In some embodiments, the capacitor dielectriclayer 320 is a silicon nitride layer deposited by low-temperature CVD orplasma-enhanced CVD (PECVD) methods. In some embodiments, the capacitordielectric layer 320 is a silicon nitride layer of a thickness of about250 Angstroms or less formed by a PECVD method at a process temperatureless than about 200 degree Celsius, thereby achieving an enhancedcapacitance density in the MIM capacitor 300 greater than about 2fF/cm². In at least one exemplary embodiment, the formation of the MIMcapacitor 300 includes the step of forming the lower metal layer 310 onthe exposed portions of the first landing region 208B₁ along thesidewalls and bottom of the opening 210 a of the second polymer layer210 by depositing, photolithography and etching methods. Then, thecapacitor dielectric layer 320 and the upper metal layer 330 aresuccessively deposited on the resulted surface followed byphotolithography and etching processes such that the capacitordielectric layer 320 and the upper metal layer 330 are formed on thelower metal layer 310.

Referring to FIG. 6, a barrier layer 212 is formed on the resultedstructure to cover the MIM capacitor 300, the second polymer layer 210and the exposed portion of the second landing region 208B₂ of the PPIstructure 208. In some embodiments, the barrier layer 212 includes atleast one metallization layer comprising titanium (Ti), tantalum (Ta),titanium nitride (TiN), tantalum nitride (TaN), copper (Cu), copperalloys, nickel (Ni), tin (Sn), gold (Au), or combinations thereof. Insome embodiments, the barrier layer 212 includes at least one Ti layerand at least one Cu layer.

Referring to FIG. 7, a mask layer 214 is then formed on the barrierlayer 212 for defining bump windows. In an embodiment, the mask layer214 is formed of a photoresist which is patterned with openings 214 a.In some embodiments, the openings 214 a are directly over the firstlanding region 208B₁ and/or the second landing region 208B₂. In someembodiments, at least one of the openings 214 a is directly over the MIMcapacitor 300. The embodiment of FIG. 7 shows the openings 214 a overthe first landing region 208B₁ on which the MIM capacitor 300 is formedand the second landing region 208B₂ on which the MIM capacitor 300 isnot formed. Next, a plating step is performed to form under-bumpmetallization (UBM) layers 216 within the openings 214 a, so that theUBM layers 216 are formed over the exposed portions of the barrier layer212 to make electrical contact with the PPI structures 208. In someembodiments, the UBM layers 216 are formed of copper, copper alloys,aluminum, aluminum alloys, or the like. The UBM layers 216 may be formedas thin layers or pillars.

Referring to FIG. 8, the mask layer 214 is removed followed bypatterning of the barrier layer 212, so that portions of the barrierlayer 212 not covered by the UBM layers 216 are etched away and portionsof the second polymer layer 210 not covered by the UBM layers 216 areexposed again.

Referring to FIG. 9, at least one bump 218 is formed on at least one ofthe UBM layers 216. In some embodiments, one bump 218 is formed on eachof the UBM layers 216. In some embodiments, the bumps 218 are solderbumps, Cu bumps, metal bumps including Ni or Au, or combinationsthereof. In some embodiments, the bumps 218 are solder bumps formed byplacing solder balls on the UBM layers 216 and then thermally reflowingthe solder balls. In at least one embodiment, the solder bumps have adiameter greater than about 200 μm. In some embodiments, the solder bumpincludes a lead-free pre-solder layer, SnAg, or a solder materialincluding alloys of tin, lead, silver, copper, nickel, bismuth, orcombinations thereof. In some embodiments, the solder bump is formed byplating a solder layer using photolithography technologies followed byreflow processes.

Next, as shown in FIG. 10, The reconstructed wafer 400 is detached fromthe carrier wafer 200, and sawed into a plurality of individual packages400A (also referred to herein as fan-out packages). The fan-out package400A includes at least one chip 100 formed in the chip area I, at leastone MIM capacitor 300 formed on the second polymer layer 210 in the chiparea I, and the fan-out interconnects formed in the chip area I and/orfan-out area II. The MIM capacitor 300 is formed on the second polymerlayer 210, in which the upper metal layer 310 electrically connects tothe UBM layer 216 and the lower metal layer 310 electrically connects tothe PPI structure 208. The arrangement of the MIM capacitor 300, the UBMlayer 216 and the PPI structure 208 can reduce back-end-of-line (BEOL)routing layers, save silicon area costs and reduce routing resistance.The above described process is applicable to analog, mixed-signal and RFdevices.

The fan-out package 400A of FIG. 9 shows the embodiment of forming theMIM capacitor 300 on the second polymer layer 210 within the chip areaI. In another embodiment, the fan-out package 400B of FIG. 11 shows theMIM capacitor 300 formed on the second polymer layer 210 on the fan-outarea II, in which the MIM capacitor 300 can electrically connect the PPIstructure 208 which extends to the fan-out area II. In some embodiments,the MIM capacitors 300 can be formed in both of the chip area I and thefan-out area II.

FIG. 12 is a cross-sectional view of a package with a MIM capacitoraccording to one or more embodiments. An isolation coating 220 is formedafter the formation of the UBM layers 216. The isolation coating 220 isformed to cover the UBM layers 216 and the second polymer layer 210, andthen patterned to form at least one opening 220 a exposing a UBM layer216 b on which a bump 218 will be formed, while a UBM layer 216 a formedon the MIM capacitor 300 is still covered by the isolation coating 220.Next, the bump 218 is formed on the exposed portion of the UBM layer 216b. The fan-out package 400C of FIG. 12 shows the embodiment of formingthe MIM capacitor 300 on the second polymer layer 210 within the chiparea I. In another embodiment, the fan-out package 400D of FIG. 13 showsthe MIM capacitor 300 on the second polymer layer 210 within the fan-outarea II, in which the MIM capacitor 300 can electrically connect the PPIstructure 208 that extends to the fan-out area II.

FIGS. 14-16 are cross-sectional views of packages with MIM capacitors ondual PPI structures according to one or more embodiments. Theexplanation of the same or similar portions to the description in FIGS.1-13 will be omitted.

Referring to FIG. 14, a plurality of dual PPI structures is formed overthe first polymer layer 206. Each of the dual PPI structures includes afirst PPI structure 208I and a second PPI structure 208II. The first PPIstructure 208I is formed between the first polymer layer 206 and thesecond polymer layer 210 and electrically coupled to the contacts 18 ofthe chips 100. The second PPI structure 208II is formed on the secondpolymer layer 210 and covered by a third polymer layer 222, and iselectrically coupled to the first PPI structure 208I through openings inthe second polymer layer 210. In some embodiments, MIM capacitors can beformed over at least one of the first polymer layer 206, the secondpolymer layer 210 or the third polymer layer 222. In some embodiments,MIM capacitors can be formed on the first PPI structure 208I, the secondPPI structure 208II or combinations thereof. In some embodiments, MIMcapacitors can be formed in the chip area I, the fan-out area II orcombinations thereof.

With reference to FIG. 14, a MIM capacitor 300A includes a lower metallayer, a dielectric layer and an upper metal layer formed on the thirdpolymer layer 222 and electrically coupled to the second PPI structure208II through an opening in the third polymer layer 222. The barrierlayer 212 and the UBM layer 216 may be formed on the MIM capacitor 300A.In some embodiments, the MIM capacitor 300A can be formed in the chiparea I, the fan-out area II or the combinations thereof.

With reference to FIG. 15, a MIM capacitor 300B is formed over thesecond polymer layer 210. In at least one embodiment, the MIM capacitor300B includes an upper metal layer 330B, a capacitor dielectric layer320B and a lower metal layer 310B that is a part of the second PPIstructure 208II and/or the first PPI structure 208I. In someembodiments, the MIM capacitor 300B can be formed in the chip area I,the fan-out area II or combinations thereof.

With reference to FIG. 16, a MIM capacitor 300C is formed in the secondpolymer layer 210. In at least one embodiment, the MIM capacitor 300Cincludes an upper metal layer 330C, a capacitor dielectric layer 320Cand a lower metal layer 310C that is a part of the first PPI structure208I. In some embodiments, the MIM capacitor 300C can be formed in thechip area I, the fan-out area II or combinations thereof.

FIGS. 17-21 are cross-sectional views of a package at various stages ofa method of manufacturing the package with a MIM capacitor according tostill other embodiments.

As shown in FIG. 17, the mask layer 214 formed on the barrier layer 212is patterned with openings 214 a. In some embodiments, the openings 214a are directly over the first landing region 208 _(B1) and the secondlanding region 208 _(B2), and a third landing pad region 208 _(B3). Thethird landing pad region 208 _(B3) is adjacent to the first landingregion 208 _(B1), such that the barrier layer 212 continuously formed onthe first landing region 208 _(B1) and the third landing pad region 208_(B3) is exposed by the opening 214 a. Next, a plating step is performedto form the UBM layers 216 within the openings 214 a, respectively, sothat the UBM layers 216 are formed over the exposed portions of thebarrier layer 212 to electrically contact with the PPI structures 208.

Referring to FIG. 18, the mask layer 214 is removed followed bypatterning of the barrier layer 212, so that portions of the barrierlayer 212 not covered by the UBM layers 216 are etched away and portionsof the second polymer layer 210 not covered by the UBM layers 216 areexposed again. In at least one embodiment, the third landing pad region208B₃ of the PPI structure 208 adjacent to the MIM structure 300 iscovered by the UBM layer 216 and the barrier layer 212.

Referring to FIG. 19, an isolation coating 220 is formed to cover theUBM layers 216 and the second polymer layer 210, and then patterned toform at least one opening 220 a exposing the UBM layer 216 b on which abump 218 will be formed, while the UBM layer 216 a formed on the MIMcapacitor 300 is still covered by the isolation coating 220. Theisolation layer 220 may prevent oxidation on the UBM layer 216. In atleast one embodiment, the isolation coating 220 is formed of a samematerial as the second polymer layer 210.

Next, as shown in FIG. 20, the bump 218 is formed on the exposed portionof the UBM layer 216 b. Next, as shown in FIG. 21, the reconstructedwafer 400 is detached from the carrier wafer 200, and sawed into aplurality of individual packages 400E. The fan-out package 400E of FIG.20 shows the embodiment of forming the MIM capacitor 300 on the secondpolymer layer 210 within the chip area I. In another embodiment of thefan-out package 400E, the MIM capacitor 300 can be formed on the secondpolymer layer 210 within the fan-out area II, in which the MIM capacitor300 can electrically connect with the PPI structure 208 that extends tothe fan-out area II.

According to the embodiments, a package includes a chip formed in afirst area of the package and a molding compound formed in a second areaof the package adjacent to the first area. A first polymer layer isformed on the chip and the molding compound, a second polymer layer isformed on the first polymer layer, and a plurality of interconnectstructures is formed between the first polymer layer and the secondpolymer layer. A metal-insulator-metal (MIM) capacitor is formed on thesecond polymer layer and electrically coupled to at least one of theplurality of interconnect structures. A metal bump is formed over andelectrically coupled to at least one of the plurality of interconnectstructures.

According to some embodiments, a package includes a chip formed in afirst area of the package, a molding compound formed in a second area ofthe package adjacent to the first area. A first polymer layer is formedon the chip and the molding compound, a second polymer layer is formedon the first polymer layer, and a third polymer layer is formed on thesecond polymer layer. A first interconnect structure is formed betweenthe first polymer layer and the second polymer layer, and a secondinterconnect structure is formed between the second polymer layer andthe third polymer layer and electrically coupled to the firstinterconnect structure. A metal-insulator-metal (MIM) capacitor isformed in at least one of the second polymer layer and the third polymerlayer, and electrically coupled to at least one of the firstinterconnect structure and the second interconnect structure.

While the present disclosure has been particularly shown and describedwith reference to example embodiments thereof, a skilled person in theart will appreciate that there can be many embodiment variations of thisdisclosure. Although the embodiments and their features have beendescribed in detail, it should be understood that various changes,substitutions and alterations can be made herein without departing fromthe spirit and scope of the embodiments.

The above method embodiments show exemplary steps, but they are notnecessarily required to be performed in the order shown. Steps may beadded, replaced, changed order, and/or eliminated as appropriate, inaccordance with the spirit and scope of embodiment of the disclosure.Embodiments that combine different claims and/or different embodimentsare within scope of the disclosure and will be apparent to those skilledin the art after reviewing this disclosure.

What is claimed is:
 1. A package comprising: a chip and a moldingcompound adjacent to each other; a first polymer layer and a secondpolymer layer that are stacked on the chip and the molding compound,wherein the second polymer layer overlies the first polymer layer; afirst interconnect structure between the first and second polymerlayers; a capacitor on the second polymer layer and protruding throughthe second polymer layer to the first interconnect structure, whereinthe capacitor comprises a lower electrode, a dielectric layer overlyingthe lower electrode, and an upper electrode overlying the dielectriclayer; a barrier layer overlying and independent of the upper electrode,wherein the barrier layer is conductive; a metal layer overlying thebarrier layer, wherein the capacitor, the barrier layer, and the metallayer collectively define a first common sidewall and collectivelydefine a second common sidewall on an opposite side of the capacitor asthe first common sidewall; an isolation coating covering the first andsecond polymer layers and the metal layer, wherein the isolation coatingdirectly contacts a top surface of the metal layer continuously from thefirst common sidewall to the second common sidewall; and a conductivebump in an opening defined by the isolation coating and level with thecapacitor.
 2. The package according to claim 1, wherein the first andsecond common sidewalls are smooth continuously from the top surface ofthe metal layer to a top surface of the second polymer layer.
 3. Thepackage according to claim 2, wherein the isolation coating directlycontacts the first and second common sidewalls continuously from the topsurface of the metal layer to the top surface of the second polymerlayer.
 4. The package according to claim 2, wherein the lower electrodeoverlies and directly contacts the top surface of the second polymerlayer, and wherein the dielectric layer and the upper electrode overhangthe top surface of the second polymer layer.
 5. The package according toclaim 1, wherein lower electrode, the dielectric layer, and the upperelectrode each individually define a portion of the first commonsidewall and each individually define a portion of the second commonsidewall, and wherein the first and second common sidewalls aresubstantially planar.
 6. The package according to claim 1, wherein theisolation coating directly contacts the first and second commonsidewalls continuously from the top surface of the metal layer to a topsurface of the second polymer layer.
 7. The package according to claim1, further comprising: a second interconnect structure between the firstand second polymer layers; and an under-bump metallization (UBM)structure on the second polymer layer and extending through the secondpolymer layer to the second interconnect structure, wherein the UBMstructure cups an underside of the conductive bump and comprises a samematerial as the barrier layer and a same material as the metal layer. 8.The package according to claim 1, wherein the isolation coating has adownward protrusion directly over the capacitor, and wherein the topsurface of the metal layer wraps around the downward protrusion.
 9. Apackage comprising: a chip and a molding compound that laterallyneighbor each other; a polymer layer on the chip and the moldingcompound; a first interconnect structure and a second interconnectstructure both buried in the polymer layer and laterally spaced fromeach other; a first metal electrode directly on the first interconnectstructure; an insulator layer overlying and directly on the first metalelectrode, wherein the insulator layer extends along a sidewall of thefirst metal electrode, and wherein the first metal electrode and theinsulator layer partially define a metal-insulator-metal (MIM) device; abarrier layer overlying the insulator layer and directly contacting asidewall of the insulator layer, wherein the barrier layer extends fromthe sidewall of the insulator layer to the second interconnectstructure; and a metal layer covering and conforming to the barrierlayer.
 10. The package according to claim 9, wherein the insulator layerwraps around a top corner of the first metal electrode at the sidewallof the first metal electrode.
 11. The package according to claim 9,further comprising: a second metal electrode underlying and directlycontacting the barrier layer, wherein the barrier layer and the secondmetal electrode share a common element, and wherein the second metalelectrode overlies the insulator layer and partially defines the MIMdevice.
 12. The package according to claim 9, wherein the barrier layercomprises a titanium layer and a copper layer, and wherein the metallayer comprises a different material than the barrier layer.
 13. Thepackage according to claim 9, further comprising: a solder bumpoverlying the polymer layer and level with the MIM device.
 14. Thepackage according to claim 9, wherein the first metal electrode, theinsulator layer, the barrier layer, and the metal layer each protrudedownward at the MIM device, and wherein the barrier layer and the metallayer further protrude downward at the second interconnect structure.15. The package according to claim 9, further comprising: an isolationcoating covering the MIM device and the polymer layer, wherein theisolation coating directly contacts a sidewall of the barrier layer andanother sidewall of the insulator layer, and wherein the isolationcoating directly contacts a top surface of the metal layer from alocation directly over the MIM device to a location directly over thesecond interconnect structure.
 16. A package comprising: a chip and amolding compound that neighbor, wherein the chip comprises a first padand a first via overlying the first pad, and wherein the first viaextends upward from the first pad to a top surface of the first via thatis level with a top surface of the molding compound; a first polymerlayer and a second polymer layer that are stacked on the chip and themolding compound, wherein the second polymer layer overlies the firstpolymer layer; a first interconnect structure between the first andsecond polymer layers, wherein the first interconnect structure overliesa top surface of the first polymer layer and has a protrusion protrudingdownward through the first polymer layer to directly contact the topsurface of the first via; a dielectric layer overlying and directly onthe first interconnect structure; and an electrode overlying anddirectly on the dielectric layer, wherein the dielectric layer and theelectrode overhang the top surface of the first polymer layer andprotrude downward at the protrusion of the first interconnect structure,and wherein the dielectric layer, the electrode, and the protrusion ofthe first interconnect structure define a capacitor.
 17. The packageaccording to claim 16, wherein the chip comprises: an insulator layeroverlying the first pad and having a top surface that is level with thetop surface of the molding compound and the top surface of the firstvia, wherein the protrusion of the first interconnect structureprotrudes to direct contact with the top surface of the insulator layer.18. The package according to claim 17, further comprising: a passivationlayer on a sidewall of the first pad, wherein the first via extendsthrough the passivation layer and is pillar shaped.
 19. The packageaccording to claim 16, wherein the chip further comprises a second padand a second via overlying the second pad, wherein the second viaextends upward from the second pad to a top surface of the second viathat is level with the top surface of the molding compound, and wherethe first polymer layer partially covers the top surface of the secondvia and directly contacts the top surface of the second via.
 20. Thepackage according to claim 16, further comprising: a third polymer layeroverlying the second polymer layer, wherein the third polymer layer hasa protrusion protruding downward through the second polymer layer todirect contact with the first interconnect structure; and a secondinterconnect structure between the second and third polymer layers,wherein the second interconnect structure extends laterally along a topsurface of the second polymer layer and has a protrusion protrudingdownward through the second polymer layer to the first interconnectstructure, and wherein the protrusion of the second interconnectstructure directly contacts the protrusion of the third polymer layerand a sidewall of the second polymer layer.